For micro-nano devices, photonic chips, thin-film batteries, and detector micro-area testing, the most troublesome issue has always been the alignment difficulty: traditional probe holders require drilling holes for fixation and using bolts for locking, which are cumbersome to assemble and disassemble, and cause relocation problems. Even slight vibrations on the tabletop or slight adjustments in the travel range can lead to probe contact point drift. During long-term weak signal testing, a tiny displacement deviation can completely overturn PA-level dark current, transient response, and low-resistance test data, and significantly reduce the repeatability of retesting.

The core of precise micro-testing lies in fast installation, accurate alignment, stable fixation, and smooth adjustment. This magnetic force adsorption three-dimensional probe holder is specially designed for laboratory precise micro-area testing. With a switchable strong magnetic base and a three-axis micron-level fine adjustment structure, it says goodbye to the traditional cumbersome fixation methods, balancing flexibility expansion and ultimate stability. It is a necessary research tool for photonic micro-area characterization, weak signal acquisition, and precise electrical testing.

Controllable strong magnetic adsorption, quick installation without drilling, stable against vibrations with zero displacement

It completely overturns the traditional bolt fixation mode. The base is equipped with a switchable strong magnetic suction structure, which does not require drilling or platform modification. It can be firmly adsorbed on the steel optical platform or experimental table surface with a maximum adsorption force of up to 10KG, and the locking is stable and does not loosen. The exclusive magnetic switch design allows for free switching of the magnetic suction state, one-click release of the magnet, and flexible relocation as needed, suitable for flexible setup of testing systems in various scenarios.

After magnetic adsorption locking, the center of gravity is stable, resistant to vibration, and free from displacement. It can effectively isolate minor vibrations caused by equipment operation, human touch, and environmental airflow, completely eliminating probe micro-drift, contact point short circuit, and test jitter problems. Whether it is short-term precise alignment testing or long-term aging monitoring for several hours, or stable signal acquisition, it always maintains stable contact points, physically stabilizing the experimental benchmark, and completely solving the problem of data jumps and curve fluctuations caused by vibration.

Three-axis micron-level fine adjustment, zero travel alignment, smooth and precise adjustment

Equipped with imported precision cross-roller guide rails + high-resolution differential heads, it realizes independent micrometer-level fine adjustment in the X, Y, and Z axes. The adjustment is smooth without jamming, without return travel, and has extremely high positioning accuracy. It can precisely lock micro-electrodes, photosensitive micro-area, and small test points, perfectly adapting to the precise piercing testing of micro-micron-level miniature devices. It completely eliminates the common problems of rough fine adjustment, alignment deviation, and slow adjustment in ordinary probe holders, and each knob adjustment provides precise feedback, is controllable, and traceable.

Supports multi-angle free adjustment, enabling horizontal rotation + directional locking. It can easily adapt to irregular samples, narrow testing spaces, and microscopic light path scenarios. The adjustment process does not block the observation field of vision or hinder the testing light path, achieving integrated operations of microscopic observation, precise alignment, stable piercing, and stable testing, significantly improving the efficiency and accuracy of micro-area testing.

Low-resistance shielding structure, accurately capturing PA-level weak signals

For high-precision scenarios such as photonic testing, low-resistance device testing, dark current testing, and EIS impedance testing, the probe holder adopts a combination process of beryllium copper probe rods + gold-plated probe heads, which are resistant to oxidation, corrosion by electrolyte, and have extremely low contact impedance. It does not oxidize, wear, or affect conductivity performance over repeated piercing for a long time. It has a multi-layer shielding structure that can effectively isolate external electromagnetic interference, with leakage accuracy reaching pA level, accurately capturing easily interfered-with weak photonic and electrical signals, making the test curve smooth and stable, and the parameter data closely matching the performance of the device itself.

Compatible with multiple types of professional interfaces such as BNC and three coaxial connectors, it can directly connect to source meters, photonic testing systems, signal amplifiers, electrochemical workstations, etc., without the need for conversion or modification, quickly building a high-precision micro-area testing platform, fully meeting the strict data standards for publication in papers, project funding, and precise quality inspection.

Highly precise and durable, adaptable to all scenarios of precise research.

The entire machine is made of aviation aluminum alloy, and is treated with meticulous sandblasting and oxidation processes. It is lightweight, structurally sturdy, resistant to deformation, wear and tear, and aging. It is not affected by laboratory electrolyte infiltration, high-frequency fine adjustment, or long-term continuous operation. Its long-term use does not result in loss of accuracy or loosening of the structure. The machine is compact and small, supporting multiple combinations, enabling the rapid setup of multi-channel parallel testing systems, and meeting the needs of batch sample comparison testing and multi-point synchronous characterization.

It is widely compatible with various samples such as photodetectors, PD photodiode chips, thin-film batteries, dye-sensitized batteries, micro-nano sensors, and miniature energy storage devices for micro-area electrical testing, photoelectric response characterization, aging monitoring, and precise teaching and training. It also caters to both basic experiments and advanced high-end research scenarios.

Flexible and stable measurement, making precise research no longer compromise

Micro-area precise testing requires both flexibility and stability. Traditional equipment is either rigid and cumbersome to set up or lacks stability but is flexible. This magnetic adsorption three-dimensional probe holder breaks limitations with quick magnetic installation and ensures precision with micrometer fine adjustment, balancing convenience and professionalism. It helps you save the cumbersome fixed and debugging process, reduce invalid re-testing, and avoid system errors, making each micro-area test precise, controllable, efficient, and worry-free.

Controllable strong magnetic quick installation | Micrometer zero offset fine adjustment | Shockproof and anti-shake stable measurement | Low resistance shielding signal | Precision expandable | Full scene compatibility

Empowering micro-nano research with precise hardware, stabilizing test accuracy, and improving experimental efficiency, ensuring that every set of weak signal data is true and reliable and can withstand verification!