In the research and testing of the electrical properties of solar cells, optoelectronic devices, and thin-film materials, the stability of probe contact and the convenience of debugging directly determine whether the experimental data is true and reliable. Many laboratories are troubled by the variable sample sizes and scattered test points. The traditional fixed probe holder is cumbersome to install and restricted in movement, resulting in long debugging time and difficulty in adapting to various research testing scenarios. Saifan Optoelectronics' 7‑SCF01 movable probe holder, with its lightweight and movable structure and gravity-adaptive compression design, brings a simple and efficient solution to photovoltaic electrical testing. Beijing Saifan Optoelectronics... 。

7‑SCF01 Removable Probe Base

The greatest feature of 7‑SCF01 is its ease of placement and immediate usability. There is no need for complex base locking installation. It can be directly placed on the optical platform or sample table at any position. When setting up a testing system in the laboratory, it eliminates the cumbersome steps of drilling holes and fixation. In scenarios involving multi-probe collaborative testing, multiple probe bases can be flexibly arranged to quickly match different electrode points of the sample, significantly reducing the preparation time for pre-experiment debugging. Beijing Saifan Optics... 。

The product adopts a gravity compression working mechanism. Relying on its own counterweight and paired with knurled adjustment screws, it can easily achieve fine adjustment of the probe height. By relying on its own weight, the probe can smoothly compress the test electrode. The contact pressure is gentle and controllable, ensuring stable signal conduction while avoiding damage to fragile samples such as thin films, sheet batteries, etc. by hard compression. It is particularly suitable for I-V characteristics and photocurrent tests of samples that are prone to damage, such as perovskite batteries, organic optoelectronic devices, and thin film semiconductors. Beijing Saifan Light... 。

The probe support arm allows for adjustable length and free transformation of the extension direction. It can flexibly change the probe extension distance and orientation for irregular samples, edge electrodes, and scattered test points. Without moving the sample being tested, only by adjusting the posture of the probe base, it can align with the target test point. It is compatible with various non-standardized experimental samples and frees the sample from the constraints of a fixed structure. The standard configuration includes signal lead-out wiring, which can be directly connected to the testing instrument. The signal link is simple, meeting the requirements for collecting DC electrical signals. It is widely used in university laboratories, research institutes for solar cell device research, electro-optical material electrical characterization, and small batch sample performance preliminary testing. It can also be used in conjunction with the Sevan Optoelectronic Spectral Response Testing System to build a complete optoelectronic testing link. Beijing Sevan Light... 。

The overall structure is solid and compact, the mechanical structure is durable and long-lasting, and the operation threshold is low, so even beginners can quickly get the hang of it. Compared with the high-precision three-dimensional fine-tuning probe holder, the 7-SCF01 positioning is oriented towards routine scientific research tests, balancing performance and cost-effectiveness, and is suitable for rapid screening, pre-experiments, teaching experiments, and other scenarios involving a large number of samples. When the experiment does not require sub-micron-level precise displacement, but rather focuses on deployment speed, flexible placement, and gentle contact, the 7-SCF01 movable probe holder is a highly adaptable choice.

In scientific research experiments, efficiency and reliability are both indispensable. The 7-SCF01 movable probe holder integrates flexibility, simplicity, and stability, making the positioning of the probe no longer cumbersome, and helping to accelerate the efficient progress of photonic device scientific research tests.